State of the art testing equipment at Danish EMS firm GPV International

Competences in Test Development

Testing Conception – Development and Setup

Electronics, cable-harness-assemblies and mechanics have become increasingly complex.

This is countered in the manufacturing process of items at GPV, where test strategy and development have become highly advanced and important phases.

Through this development, we have geared our set-up to handle the challenges of higher testing demands.


Development of a testing concept via quality and reliability determinative procedures:

  • Circuitry analysis
  • Definition of the profundity of the tests
  • Development of a testing concept
  • Construction and configuration of testing systems, incl. software
  • Realisation of customised tests

Test setup at Danish EMS company GPV

Testing Options

Whether the test methods are visual, electrical or conducted employing other methods, we provide different test options which, individually or combined, contribute to an optimum result and the desired quality. Some of them are:


  • 3D Solder paste inspection system
  • Automatic Optical Inspection (AOI)
  • Optical Inspection pursuant to IPC-A 610
  • X-ray


Cable Assemblies (Contacts)

  • Pull-off force test
  • Electrical test for cables
  • Push-back test
  • Microsection analysis
  • Checking of crimp and solder connections


  • Boundary Scan («B-SCAN»)
  • Flying Prober (FP)
  • In-Circuit Test (ICT)
  • MDA-Test
  • Function Test (FT)
  • High Voltage Test
  • Standard-compliant test on electrical devices or systems
  • Insulation Measurement
  • Insulation Test
  • Stress Test


  • Leak test for housings
  • Final tests

The Right Test Strategy

An optimum test strategy is extremely worthwhile as, if the test method has been defined in the concept phase and all test points are already implemented in the first PCB layout, decisive advantages can be gained from this:

Testing of manufactured PCB at GPV, the largest EMS company in Denmark
  • An optimum cost/benefit ratio
  • Test methods which best suit requirements
  • High degree of test coverage
  • High yield and lowest field failure risk
  • Short test runs
  • Low test costs
  • Highest quality and minimum reworking
  • Option for statistical measurement analysis